Defective Behaviour of an 8T SRAM Cell with Open Defects
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05617198.pdf (680,6Kb) (Restricted access)
Document typeConference report
Date issued2010
Rights accessRestricted access - publisher's policy
CitationRodríguez, R. [et al.]. Defective Behaviour of an 8T SRAM Cell with Open Defects. A: International Conference on Advances in System Testing and Validation Lifecycle. "Second International Conference on Advances in System Testing and Validation Lifecycle". Niça: 2010, p. 81-86.
ISBN978-1-4244-7784-5
Publisher versionhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5617198
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