Now showing items 1-20 of 21

  • 8T SRAM Cell with Open Defects under Voltage and Timing Variations 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Castillo Muñoz, Raul (2011)
    Conference report
    Open Access
  • Backside polishing detector: a new protection against backside attacks 

    Manich Bou, Salvador; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Mujal Colell, Jordi; Hernández García, David (2015)
    Conference report
    Open Access
    Secure chips are in permanent risk of attacks. Physical attacks usually start removing part of the package and accessing the dice by different means: laser shots, electrical or electromagnetic probes, etc. Doing this ...
  • BIST Architecture to Detect Defects in TSVs During Pre-Bond Testing 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2013)
    Conference report
    Restricted access - publisher's policy
    Through Silicon Vias (TSVs) are critical elements in three dimensional integrated circuits (3-D ICs). The detection of defective TSVs in the earliest process step is of major concern. Hence, testing TSVs is usually done ...
  • Defective Behaviour of an 8T SRAM Cell with Open Defects 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pàmies, Joan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto (2010)
    Conference report
    Restricted access - publisher's policy
  • Design and validation of a platform for electromagnetic fault injection 

    Balasch, Josep; Arumi Delgado, Daniel; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2018)
    Conference report
    Open Access
    Security is acknowledged as one of the main challenges in the design and deployment of embedded circuits. Devices need to operate on-the-field safely and correctly, even when at physical reach of potential adversaries. One ...
  • Diagnosis of full open defects in interconnecting lines 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram; Lousberg, M.; Majhi, A.K. (IEEE, 2007-05-31)
    Conference report
    Open Access
    A proposal for enhancing the diagnosis of full open defects in interconnecting lines of CMOS circuits is presented. The defective line is first classified as fully opened by means of a logic-based diagnosis tool (Faloc). ...
  • Diagnosis of full open defects in interconnect lines with fan-out 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram (IEEE Press. Institute of Electrical and Electronics Engineers, 2010-05-24)
    Conference report
    Open Access
    The development of accurate diagnosis methodologies is important to solve process problems and achieve fast yield improvement. As open defects are common in CMOS technologies, accurate diagnosis of open defects becomes ...
  • Gate leakage impact on full open defects in interconnect lines 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram (2011-06)
    Article
    Open Access
    An Interconnect full open defect breaks the connection between the driver and the gate terminals of downstream transistors, generating a floating line. The behavior of floating lines is known to depend on several factors, ...
  • Impact of gate tunnelling leakage on CMOS circuits with full open defects 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, S.; Hora, Camelia; Kruseman, B. (Institution of Electrical Engineers, 2007-10)
    Article
    Open Access
    Interconnecting lines with full open defects become floating lines. In nanometric CMOS technologies, gate tunnelling leakage currents impact the behaviour of these lines, which cannot be considered electrically isolated ...
  • Localization and electrical characterization of interconnect open defects 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Beverloo, Willem; Vries, Dirk K. de; Eichenberger, Stefan; Volf, Paul A. J. (2010-02)
    Article
    Open Access
    A technique for extracting the electrical and topological parameters of open defects in process monitor lines is presented. The procedure is based on frequency-domain measurements performed at both end points of the ...
  • Post-Bond test of through-silicon vias with open defects 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan (2014)
    Conference report
    Restricted access - publisher's policy
    Through Silicon Vias (TSVs) are critical elements in three dimensional integrated circuits (3-D ICs) and are susceptible to undergo defects at different stages: during their own fabrication, the bonding stage or during ...
  • Postbond test of through-silicon vias with resistive open defects 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan (2019-07-17)
    Article
    Open Access
    Through-silicon vias (TSVs) technology has attracted industry interest as a way to achieve high bandwidth, and short interconnect delays in nanometer three-dimensional integrated circuits (3-D ICs). However, TSVs are ...
  • Prebond testing of weak defects in TSVs 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan (2015-08-07)
    Article
    Restricted access - publisher's policy
    Through-silicon vias (TSVs) are critical elements in 3-D integrated circuits susceptible to defects during fabrication and lifetime. It is desirable to detect defective TSVs in the early steps of the fabrication process ...
  • Random masking interleaved scrambling technique as a countermeasure for DPA/DEMA attacks in cache memories 

    Neagu, Mădălin; Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador (2016-11-15)
    Conference report
    Open Access
    Memory remanence in SRAMs and DRAMs is usually exploited through cold-boot attacks and the targets are the main memory and the L2 cache memory. Hence, a sudden power shutdown may give an attacker the opportunity to ...
  • Resistive open defect characteritzation in 3D 6T SRAM memories 

    Castillo, Raúl; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa (2014)
    Conference report
    Restricted access - publisher's policy
    The relentless decrease in feature size and the increase of density requirements in Integrated Circuit (IC) manufacturing arise new challenges that must be overcome. One of the most promising alternatives is three-dimensional ...
  • RRAM based cell for hardware security applications 

    Arumi Delgado, Daniel; Manich Bou, Salvador; Rodríguez Montañés, Rosa (2016)
    Conference report
    Restricted access - publisher's policy
    Resistive random access memories (RRAMs)have arisen as a competitive candidate for non-volatile memories due to their scalability, simple structure, fast switching speed and compatibility with conventional back-end processes. ...
  • RRAM Based Random Bit Generation for Hardware Security Applications 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Manich Bou, Salvador; Pehl, Michael (Institute of Electrical and Electronics Engineers (IEEE), 2016)
    Conference report
    Open Access
    Resistive random access memories (RRAMs) have arisen as a competitive candidate for non-volatile memories due to their scalability, simple structure, fast switching speed and compatibility with conventional back-end ...
  • RRAM serial configuration for the generation of random bits 

    Arumi Delgado, Daniel; Gonzalez, Mireia B.; Campabadal, Francesca (2017-06-25)
    Article
    Open Access
  • Test escapes of stuck-open faults caused by parasitic capacitances and leakage currents 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras, Joan (2015-09-24)
    Article
    Open Access
    Intragate open defects are responsible for a significant percentage of defects in present technologies. A majority of these defects causes the logic gate to become stuck open, and this is why they are traditionally modeled ...
  • The SALVADOR simulation framework 

    Weiner, Michael; Manich Bou, Salvador; Arumi Delgado, Daniel (2016-11-15)
    Conference report
    Open Access