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A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits

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10.1109/MWSCAS.2010.5548578
 
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hdl:2117/8875

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Andrade Miceli, Dennis Michael
Calomarde Palomino, AntonioMés informacióMés informacióMés informació
Rubio Sola, Jose AntonioMés informacióMés informacióMés informació
Document typeConference report
Defense date2010
PublisherIEEE Press. Institute of Electrical and Electronics Engineers
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
Abstract—Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits due to underestimated time violations. This situation is commonly avoided adding time margins to the clock signal making it larger than nominal worstcase data process time, penalizing the global performance. In this paper a new mechanism for compensating both environmental fluctuations and process parameters variations effects on digital circuits is presented. The environmental compensation mechanism regenerates the clock signal for a pipelined system stages adding a compensated skew component depending on the local environmental conditions of every one of these stages. The process variations are corrected with a calibration circuit which adjusts the clock period in every stage taking into account its particular static deviations.
CitationAndrade, D.; Calomarde, A.; Rubio, J. A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits. A: IEEE International Midwest Symposium on Circuits and Systems. "53rd IEEE International Midwest Symposium on Circuits and Systems". Seatle, WA: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 141-144. 
URIhttp://hdl.handle.net/2117/8875
DOI10.1109/MWSCAS.2010.5548578
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