The continuing trends of device scaling and increase in complexity towards terascale system on chip level of integration are putting growing difficulties into several areas of design. The intrinsic variability problem is ...

In this paper, we present a new method to mitigate the effect of the charge collected by trigate FinFET devices after an ionizing particle impact. The method is based on the creation of an internal structure that generates ...

This brief presents a simple all-digital variable-length ring oscillator (VLRO) design that is capable of synchronously changing the output frequency while keeping a signal free of glitches or spurious oscillations at the ...

Environmental conditions are changing all the time along the chip as a consequence of its own activity, provoking deviations on propagation time in digital circuits. In future technologies, the increment of devices sensitivity ...