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A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits
dc.contributor.author | Andrade Miceli, Dennis Michael |
dc.contributor.author | Calomarde Palomino, Antonio |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2010-09-15T11:02:51Z |
dc.date.available | 2010-09-15T11:02:51Z |
dc.date.created | 2010 |
dc.date.issued | 2010 |
dc.identifier.citation | Andrade, D.; Calomarde, A.; Rubio, J. A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits. A: IEEE International Midwest Symposium on Circuits and Systems. "53rd IEEE International Midwest Symposium on Circuits and Systems". Seatle, WA: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 141-144. |
dc.identifier.uri | http://hdl.handle.net/2117/8875 |
dc.description.abstract | Abstract—Process variability and environmental fluctuations deeply affect the digital circuits performance in many different ways, one of them, the data processing time which may cause error on synchronous digital circuits due to underestimated time violations. This situation is commonly avoided adding time margins to the clock signal making it larger than nominal worstcase data process time, penalizing the global performance. In this paper a new mechanism for compensating both environmental fluctuations and process parameters variations effects on digital circuits is presented. The environmental compensation mechanism regenerates the clock signal for a pipelined system stages adding a compensated skew component depending on the local environmental conditions of every one of these stages. The process variations are corrected with a calibration circuit which adjusts the clock period in every stage taking into account its particular static deviations. |
dc.format.extent | 4 p. |
dc.language.iso | eng |
dc.publisher | IEEE Press. Institute of Electrical and Electronics Engineers |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics |
dc.subject.lcsh | Digital integrated circuits -- Design and construction |
dc.title | A comprehensive compensation technique for process variations and environmental fluctuations in digital integrated circuits |
dc.type | Conference report |
dc.subject.lemac | Circuits digitals -- Disseny |
dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.identifier.doi | 10.1109/MWSCAS.2010.5548578 |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Open Access |
local.identifier.drac | 2640250 |
dc.description.version | Postprint (published version) |
local.citation.author | Andrade, D.; Calomarde, A.; Rubio, J. |
local.citation.contributor | IEEE International Midwest Symposium on Circuits and Systems |
local.citation.pubplace | Seatle, WA |
local.citation.publicationName | 53rd IEEE International Midwest Symposium on Circuits and Systems |
local.citation.startingPage | 141 |
local.citation.endingPage | 144 |