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K1 - Supercomputers and European Sovereignty ...
(2022-05)
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Over that last 3 decades, we have witnessed a transition from closed software ecosystems being the
foundation for HPC, enterprise, and business to open source software ecosystems based on Linux:
from Arduino in the IoT ...
SP1 - Feature selection techniques for indirect test and statistical calibration of mm-wave integrated circuits
(2022-05)
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PFS - Improving the Design for Testability of Integrated Circuits Using Formal Methods and AI Techniques
(2022-05)
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S1 - Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators
(2022-05)
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Automotive Microcontrollers (MCUs) are extensively
tested to guarantee zero-defect quality. Performance
screening is one of the critical factors to ensure that MCUs meet
quality requirements. Ring Oscillator (RO) ...
ETS 2022 Distinguished Service Award
(2022-05)
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S2 - TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits
(2022-05)
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We propose TaintLock, a lightweight dynamic scan
data authentication and encryption scheme that performs perpattern
authentication and encryption using taint and signature
bits embedded within the test pattern. To prevent ...
P2 - Can DPPM of AMS Circuits Be Accurately Estimated From Their Defect Coverage?
(2022-05)
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Estimation of Defective Parts Per Million (DPPM) for digital circuits is no longer a straightforward task for
nanotechnologies, even with the help of Williams-Brown or Seth-Agarwal formulas, ATPG and wellestablished
fault ...
S5 - Enabling Coverage-Based Verification in Chisel
(2022-05)
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Ever-increasing performance demands are pushing
hardware designers towards designing domain-specific accelerators.
This has created a demand for improving the overall
efficiency of the hardware design and verification ...
S7 - Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
(2022-05)
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Embedded memories in Automotive Systems-on-Chip
usually occupy a large die area portion. Consequently, their
defectivity can strongly impact production yield for any automotive
device. Along with the technology ramp-up ...
ET2 - Power Aware Test
(2022-05)
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Power handling during test is an important requirement that needs to be considered during
chip design, silicon bring-up, and in-system testing. In this tutorial, we will start by reviewing
the importance of power and ...