S1 - Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators
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hdl:2117/372137
Document typeConference report
Defense date2022-05
Rights accessRestricted access - publisher's policy
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Abstract
Automotive Microcontrollers (MCUs) are extensively
tested to guarantee zero-defect quality. Performance
screening is one of the critical factors to ensure that MCUs meet
quality requirements. Ring Oscillator (RO) structures are used
for this performance screening. Such RO structures usually cause
routing overhead on the chip. The routing overhead increases,
especially when many ROs are implemented. This paper presents
a novel self-enabling technique that significantly reduces the
routing overhead for functional path ROs. We present a proof of
concept on a large automotive MCU. The routing overhead can
be reduced by over 80% compared to traditional approaches.
CitationKilian, T. [et al.]. S1 - Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators. A: 27th IEEE European Test Symposium (ETS). 2022,
Publisher versionhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
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S1-2.pdf | 2,118Mb | Restricted access |