S7 - Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
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hdl:2117/372157
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Data publicació2022-05
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Abstract
Embedded memories in Automotive Systems-on-Chip
usually occupy a large die area portion. Consequently, their
defectivity can strongly impact production yield for any automotive
device. Along with the technology ramp-up phase and for
statistical process control reasons during volume production, it is a
good automotive industry practice to collect diagnostic information
in addition to pure testing data. Designers and technology
experts must receive accurate diagnostic results from failing
devices to react to misbehavior by identifying and correcting
the related issues at their source and drawing correct repair
strategy conclusions. A commonly used approach resorts to the
generation of failure bitmaps based on collecting all failing bits
coordinates to be sent one by one to the tester. More efficiently,
the encountered faults can be compacted or compressed in onchip
memory resources to be retrieved by the tester at the end of
the memory test.
This paper presents an on-chip method to compact diagnostic
information during embedded memory testing. More specifically,
the method is applied to diagnose embedded FLASH memories.
This strategy permits the reconstruction of failure bitmaps without
any loss, while compression approaches obtain an approximation.
The proposed method uses a fraction of the memory requested
by a coordinate-based bit mapping approach and is comparable
to compression methods. At the cost of a moderate test time
overhead, the proposed strategy permits dramatically increasing
the number of devices that can be fully diagnosed without
any bitmap reconstruction loss. Most failing devices in a real
embedded FLASH production scenario were diagnosed after a
single transfer from on-chip to the tester host computer.
CitacióBernardi, P. [et al.]. S7 - Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. A: 27th IEEE European Test Symposium (ETS). 2022,
Versió de l'editorhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
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