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Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions
dc.contributor.author | Santos Hernández, Sergio |
dc.contributor.author | Gadelrab, Karim Raafat |
dc.contributor.author | Font Mateu, Josep |
dc.contributor.author | Chiesa, Matteo |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica |
dc.date.accessioned | 2013-10-15T18:49:26Z |
dc.date.available | 2013-10-15T18:49:26Z |
dc.date.created | 2013-08 |
dc.date.issued | 2013-08 |
dc.identifier.citation | Santos, S.M. [et al.]. Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions. "New journal of physics", Agost 2013, vol. 15. |
dc.identifier.issn | 1367-2630 |
dc.identifier.uri | http://hdl.handle.net/2117/20385 |
dc.description.abstract | Here, we enhance the capabilities of the atomic force microscope (AFM) to show that force profiles can be reconstructed without restriction by monitoring the wave profile of the cantilever during a single oscillation cycle. Two approaches are provided to reconstruct the force profile in both the steady and transient states in what we call single-cycle measurements. The robustness of the formalism is tested numerically to recover complex but relevant interactions. With single-cycle measurements, we add high temporal resolution (possibly microsecond range) to the spatial resolution of AFM. The access to simultaneous high throughput and high sensitivity further opens the door to a variety of feedback options for imaging |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject.lcsh | Oscillators, Electric |
dc.subject.lcsh | Electric circuits |
dc.subject.other | Feedback options |
dc.subject.other | Force reconstruction |
dc.subject.other | High sensitivity |
dc.subject.other | High temporal resolution |
dc.subject.other | Oscillation cycles |
dc.subject.other | Spatial resolution |
dc.subject.other | Steady and transient state |
dc.subject.other | Time-dependent interaction. |
dc.title | Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions |
dc.type | Article |
dc.subject.lemac | Oscil·ladors elèctrics |
dc.subject.lemac | Circuits elèctrics |
dc.subject.lemac | Microscòpia de força atòmica |
dc.contributor.group | Universitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control |
dc.identifier.doi | 10.1088/1367-2630/15/8/083034 |
dc.relation.publisherversion | http://iopscience.iop.org/1367-2630/15/8/083034/pdf/1367-2630_15_8_083034.pdf |
dc.rights.access | Open Access |
local.identifier.drac | 12796851 |
dc.description.version | Postprint (published version) |
local.citation.author | Santos, S.M.; Gadelrab, K.R.; Font-Mateu, J.; Chiesa, M. |
local.citation.publicationName | New journal of physics |
local.citation.volume | 15 |
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