Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions
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10.1088/1367-2630/15/8/083034
Inclou dades d'ús des de 2022
Cita com:
hdl:2117/20385
Tipus de documentArticle
Data publicació2013-08
Condicions d'accésAccés obert
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continguts d'aquesta obra estan subjectes a la llicència de Creative Commons
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Reconeixement-NoComercial-SenseObraDerivada 3.0 Espanya
Abstract
Here, we enhance the capabilities of the atomic force microscope (AFM) to show that force profiles can be reconstructed without restriction by monitoring the wave profile of the cantilever during a single oscillation cycle.
Two approaches are provided to reconstruct the force profile in both the steady
and transient states in what we call single-cycle measurements. The robustness of
the formalism is tested numerically to recover complex but relevant interactions.
With single-cycle measurements, we add high temporal resolution (possibly microsecond range) to the spatial resolution of AFM. The access to simultaneous high throughput and high sensitivity further opens the door to a variety of feedback options for imaging
CitacióSantos, S.M. [et al.]. Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions. "New journal of physics", Agost 2013, vol. 15.
ISSN1367-2630
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single_cycle.pdf | 1,041Mb | Visualitza/Obre |