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dc.contributor.authorSekulic, Ivan
dc.contributor.authorTzarouchis, Dimitrios C.
dc.contributor.authorYlä-Oijala, Pasi
dc.contributor.authorÚbeda Farré, Eduard
dc.contributor.authorRius Casals, Juan Manuel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2020-03-16T15:03:50Z
dc.date.available2020-03-16T15:03:50Z
dc.date.issued2019-04-10
dc.identifier.citationSekulic, I. [et al.]. Enhanced discretization of surface integral equations for resonant scattering analysis of sharp-edged plasmonic nanoparticles. "Physical review B", 10 Abril 2019, vol. 99, núm. 16, p. 165417-165429.
dc.identifier.issn2469-9969
dc.identifier.urihttp://hdl.handle.net/2117/180047
dc.description.abstractThe surface integral equation (SIE) method, discretized with the method of moments, is a well-established methodology for the scattering analysis of subwavelength plasmonic nanoparticles. SIEs are usually discretized with low-order basis functions that preserve the normal continuity of the surface currents across the edges arising in the meshed boundary, such as Rao-Wilton-Glisson (RWG) functions. However, the plasmonic enhancement modeling on sharp-edged particles is an extremely challenging task, especially due to the singular fields exerted at sharp corners, exposing a slow (or no) convergence in the computation of the scattering and absorption spectra. In this paper, we propose an alternative discretization strategy based on a discontinuous basis function set in conjunction with a volumetric-tetrahedral testing scheme. We demonstrate the potential of the proposed discretization scheme by studying scattering and absorption spectra of three canonical plasmonic polyhedra, i.e., a hexahedral, an octahedral, and a tetrahedral silver inclusion. The results expose an improved accuracy and faster convergence in both far-field and near-field regions when compared to the standard RWG implementation. The proposed discretization scheme can offer faster and more accurate routes towards the exploration and design of the plasmonic resonant spectrum of sharp-edged nanoparticles and nanoantennas.
dc.format.extent13 p.
dc.language.isoeng
dc.publisherAmerican Physical Society (APS)
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject.lcshOptical communications
dc.subject.lcshFotonics
dc.subject.lcshGauge fields (Physics)
dc.subject.otherElectromagnetic field calculations
dc.subject.otherElectromagnetic interactions
dc.subject.otherOptics & lasers
dc.subject.otherPlasmonics
dc.subject.otherStrong electromagnetic field effects
dc.subject.otherElectromagnetic wave theory
dc.subject.otherFinite-element method
dc.titleEnhanced discretization of surface integral equations for resonant scattering analysis of sharp-edged plasmonic nanoparticles
dc.typeArticle
dc.subject.lemacComunicacions òptiques
dc.subject.lemacFotònica
dc.subject.lemacAnàlisi numèrica
dc.subject.lemacQuàntums, Teoria dels
dc.subject.lemacCamps de galga (Física)
dc.contributor.groupUniversitat Politècnica de Catalunya. ANTENNALAB - Grup d'Antenes i Sistemes Radio
dc.identifier.doi10.1103/PhysRevB.99.165417
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://journals.aps.org/prb/abstract/10.1103/PhysRevB.99.165417
dc.rights.accessOpen Access
local.identifier.drac25169170
dc.description.versionPostprint (author's final draft)
dc.relation.projectidinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/TEC2017-84817-C2-2-R/ES/SENSORES GRAVIMETRICOS DE GASES BASADOS EN RESONADORES ELECTRO-ACUSTICOS DE ALN PARA APLICACIONES EN TEMPERATURAS EXTREMAS/
dc.relation.projectidinfo:eu-repo/grantAgreement/MINECO//TEC2013-47360-C3-1-P/ES/SISTEMAS RADIANTES EN MILIMETRICAS Y SUBMILIMETRICAS PARA RADAR, COMUNICACIONES E IMAGENES./
dc.relation.projectidinfo:eu-repo/grantAgreement/FEDER/CICYT/TEC2016-78028-C3-1-P
dc.relation.projectidinfo:eu-repo/grantAgreement/AEI/MDM-2016-0600
local.citation.authorSekulic, I.; Tzarouchis, D.; Ylä-Oijala, P.; Ubeda, E.; Rius, J.
local.citation.publicationNamePhysical review B
local.citation.volume99
local.citation.number16
local.citation.startingPage165417
local.citation.endingPage165429


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