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dc.contributor.authorVoz Sánchez, Cristóbal
dc.contributor.authorMarsal, Albert
dc.contributor.authorMoreno Sierra, César
dc.contributor.authorPuigdollers i González, Joaquim
dc.contributor.authorAlcubilla González, Ramón
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2012-01-17T17:41:02Z
dc.date.available2012-01-17T17:41:02Z
dc.date.created2012-01
dc.date.issued2012-01
dc.identifier.citationVoz, C. [et al.]. Comparison between the density-of-states of picene transistors measured in air and under vacuum. "Synthetic metals", Gener 2012, vol. 161, núm. 23-24, p. 2554-2557.
dc.identifier.issn0379-6779
dc.identifier.urihttp://hdl.handle.net/2117/14608
dc.description.abstractPicene has recently attracted much attention as the active layer in organic thin-film transistors because of its good performance in air. In this work, we have fabricated picene thin-film transistors that exhibit field-effect mobilities up to 1.3 cm2 V−1 s−1 and on/off ratios above 105 in ambient conditions. These devices have been electrically characterized over the temperature range 300–360 K in air and also under vacuum conditions. In particular, the thermal activation energy of the channel conductance as a function of the gate bias has been measured. The dependence of the activation energy on the gate bias corresponds to a gradual shift of the Fermi level towards the HOMO level as more gap states are filled by trapped holes. The density-of-states can be estimated from the derivative of the activation energy with respect to gate bias. The calculated density-of-states is compared for devices measured in air and under vacuum conditions. These results can help to understand the gas sensing capability of picene, together with its enhanced electrical performance after air exposure.
dc.format.extent4 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics::Transistors
dc.subject.lcshThin film devices
dc.subject.lcshIntegrated circuits
dc.titleComparison between the density-of-states of picene transistors measured in air and under vacuum
dc.typeArticle
dc.subject.lemacMicroelectrònica
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1016/j.synthmet.2011.10.009
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0379677911004498
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac9419366
dc.description.versionPostprint (published version)
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/FP7/227127/EU/Smart light collecting system for the efficiency enhancement of solar cells/EPHOCELL
local.citation.authorVoz, C.; Marsal, A.; Moreno, C.; Puigdollers, J.; Alcubilla, R.
local.citation.publicationNameSynthetic metals
local.citation.volume161
local.citation.number23-24
local.citation.startingPage2554
local.citation.endingPage2557


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