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Entropy as a wear out indicator: The resistor example
| dc.contributor.author | Cuadras Tomàs, Àngel |
| dc.contributor.author | Ovejas Benedicto, Victòria Júlia |
| dc.contributor.author | Quílez Figuerola, Marcos |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2014-03-12T11:38:10Z |
| dc.date.created | 2013 |
| dc.date.issued | 2013 |
| dc.identifier.citation | Cuadras, A.; Ovejas, V.; Quilez, M. Entropy as a wear out indicator: The resistor example. A: International Multi-Conference on Systems, Signals and Devices. "Proceedings of the 10th International Multi-Conference on Systems, Signals and Devices -SSD 2013". Hammamet: 2013, p. 1-5. |
| dc.identifier.isbn | 978-146736458-4 |
| dc.identifier.uri | http://hdl.handle.net/2117/22002 |
| dc.description.abstract | In this contribution we aim at proposing entropy measurements in resistive elements to characterize the induced damage due to current and Joule effect dissipation. 0.25 W off the shelf resistors are biased with constant voltage and pulsed voltage signals, leading to power dissipation in the range of 2 W - 5 W, to accelerate resistor failure. Entropy is inferred from injected power with respect to temperature evolution. Results show an entropy increase as a function of time, thus being possible to define threshold entropy prior to resistor failure. Entropy generation rate also shows a sudden increase in strongly damaged resistors. |
| dc.format.extent | 5 p. |
| dc.language.iso | eng |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject.other | damage Entropy Joule effect reliability resistor |
| dc.title | Entropy as a wear out indicator: The resistor example |
| dc.type | Conference report |
| dc.contributor.group | Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
| dc.identifier.doi | 10.1109/SSD.2013.6564142 |
| dc.relation.publisherversion | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6564142&tag=1 |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 12827359 |
| dc.description.version | Postprint (published version) |
| dc.date.lift | 10000-01-01 |
| local.citation.author | Cuadras, A.; Ovejas, V.; Quilez, M. |
| local.citation.contributor | International Multi-Conference on Systems, Signals and Devices |
| local.citation.pubplace | Hammamet |
| local.citation.publicationName | Proceedings of the 10th International Multi-Conference on Systems, Signals and Devices -SSD 2013 |
| local.citation.startingPage | 1 |
| local.citation.endingPage | 5 |