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dc.contributor.authorPouyan, Peyman
dc.contributor.authorAmat Bertran, Esteve
dc.contributor.authorRubio Sola, Jose Antonio
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2015-04-09T14:47:54Z
dc.date.available2015-04-09T14:47:54Z
dc.date.created2015
dc.date.issued2015
dc.identifier.citationPouyan, P.; Amat, Esteve; Rubio, A. Statistical Lifetime Analysis in Memristive Crossbar. A: Design, Automation and Test in Europe. "DATE Uncertainty Workshop". Grenoble: 2015.
dc.identifier.urihttp://hdl.handle.net/2117/27219
dc.description.abstractEmerging devices for future memory technologies have attracted great attention recently. Memristors are one of the most favorable such devices, due to their high scalability and compatibility with CMOS fabrication process. Alongside their benefits they also face reliability concerns. In this sense our work analyzes some sources of uncertainties in the operation of the memristive memory and next proposes an approach to determine the expected lifetime of a memristive crossbar.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectronic circuits
dc.titleStatistical Lifetime Analysis in Memristive Crossbar
dc.typeConference report
dc.subject.lemacCircuits elèctrics
dc.subject.lemacCircuits electrònics
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.rights.accessOpen Access
local.identifier.drac15377579
dc.description.versionPostprint (published version)
local.citation.authorPouyan, P.; Amat, Esteve; Rubio, A.
local.citation.contributorDesign, Automation and Test in Europe
local.citation.pubplaceGrenoble
local.citation.publicationNameDATE Uncertainty Workshop


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