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dc.contributor.authorMolina Garcia, Marc Manel
dc.contributor.authorAragonès Cervera, Xavier
dc.contributor.authorMateo Peña, Diego
dc.contributor.authorGonzález Jiménez, José Luis
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.identifier.citationMolina, M. [et al.]. Effect of high frequency substrate noise on LC-VCOs. A: IEEE International Midwest Symposium on Circuits and Systems. "2010 53rd IEEE International Midwest Symposium on Circuits and Systems". Seattle: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 157-160.
dc.description.abstractThis paper presents an experimental analysis of the performance degradation of an LC-Voltage Controlled Oscillator (LC-VCO) produced by high frequency noise present in the substrate. The spurs observed are shown to be caused by a frequency pulling mechanism. Based on the theory of injection locked oscillators, a new analytical model to predict the behavior of the LC-VCO under the effect of high frequency substrate noise is presented. The analytical model, which is successfully compared with experimental measurements on a 7 GHz LCVCO, provides rapid intuition on the relation between spurs and circuit parameters.
dc.format.extent4 p.
dc.publisherIEEE Press. Institute of Electrical and Electronics Engineers
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
dc.subject.lcshInjection locked oscillators
dc.subject.lcshIntegrated circuit noise
dc.subject.lcshPhase noise
dc.subject.lcshVoltage-controlled oscillators
dc.titleEffect of high frequency substrate noise on LC-VCOs
dc.typeConference report
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
dc.description.versionPostprint (published version)
local.citation.authorMolina, M.; Aragones, X.; Mateo, D.; González, J.
local.citation.contributorIEEE International Midwest Symposium on Circuits and Systems
local.citation.publicationName2010 53rd IEEE International Midwest Symposium on Circuits and Systems

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