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  • 6th Conference on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2016), Barcelona, 14-16 November, 2016
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Spatial Correlations in Physical Unclonable Functions

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Cita com:
hdl:2117/99325

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Wilde, Florian
Gammel, Berndt
Pehl, Michael
Document typeConference report
Defense date2016-11-15
Rights accessOpen Access
Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain
Abstract
Physical Unclonable Functions (PUFs) are circuits which extract a device dependent secret from inherently available manufacturing variations. This work focuses on evaluating the quality of such circuits regarding intra-die correlations, because canonical quality metrics for PUFs do not sufficiently cover them. Correlations reduce the effort for an attacker to guess the secret with the same severity as biases, yet canonical tests focus only on the latter. Three tests which are used to consider topological properties along with the secret are introduced and adapted to quality evaluation of PUFs. To show the efficiency and effectiveness but also the limitations of the tests, we apply them to three real-world measurement datasets from ring-oscillator PUFs on FPGAs, standard SRAM and Two-Stage PUFs on ASICs. The results show that the presented statistical tests are ideal candidates to complement state-of-the-art metrics for PUF quality.
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1: Zona Universitària-Escola T S d'Enginyers, 08028 Barcelona, Espanya
URIhttp://hdl.handle.net/2117/99325
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