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Modeling SRAM cell stability for randomness evaluation of PUF cells
dc.contributor.author | Weizman, Yoav |
dc.contributor.author | Karp, Batya |
dc.contributor.author | Keren, Osnat |
dc.coverage.spatial | east=2.11563799999999; north=41.38479239999999; name=Zona Universitària-Escola T S d'Enginyers, 08028 Barcelona, Espanya |
dc.date.accessioned | 2017-01-16T14:10:22Z |
dc.date.available | 2017-01-16T14:10:22Z |
dc.date.issued | 2016-11-14 |
dc.identifier.uri | http://hdl.handle.net/2117/99320 |
dc.format.extent | 3 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Embedded computer systems--Congresses |
dc.subject.lcsh | Integrated circuits |
dc.subject.lcsh | Computer networks--Security measures |
dc.title | Modeling SRAM cell stability for randomness evaluation of PUF cells |
dc.type | Conference report |
dc.subject.lemac | Sistemes integrats -- Congressos |
dc.subject.lemac | Circuits integrats |
dc.subject.lemac | Seguretat informàtica -- Congressos |
dc.rights.access | Open Access |