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Accuracy considerations in microstrip surface impedance measurements
dc.contributor.author | O'Callaghan Castellà, Juan Manuel |
dc.contributor.author | Sans, C. |
dc.contributor.author | Collado Gómez, Juan Carlos |
dc.contributor.author | Canet Grau, Eduard |
dc.contributor.author | Pous Andrés, Rafael |
dc.contributor.author | Fontcuberta, Josep |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
dc.date.accessioned | 2007-05-14T09:58:29Z |
dc.date.available | 2007-05-14T09:58:29Z |
dc.date.created | 1996 |
dc.date.issued | 1997-06-30 |
dc.identifier.citation | O'Callaghan, J.; Sans, C; Collado, C; Canet, E; Pous, R; Fontcuberta, J. Accuracy considerations in microstrip surface impedance measurements. IEEE Transactions on applied superconductivity, 1997, vol. 7, núm 2, p. 1869-1872. |
dc.identifier.issn | 1051-8223 |
dc.identifier.uri | http://hdl.handle.net/2117/992 |
dc.description.abstract | An approach is proposed for the design, measurement and data extraction of superconducting microstrip resonators used in determination of surface resistance and penetration depth. Major sources of error are analyzed and procedures to minimize them are given |
dc.format.extent | 1869-1872 |
dc.language.iso | eng |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
dc.subject.lcsh | Resonators |
dc.subject.lcsh | Superconductivity |
dc.subject.lcsh | Impedance (Electricity) |
dc.subject.lcsh | Microwave measurements |
dc.subject.other | electric impedance measurement |
dc.subject.other | measurement errors |
dc.subject.other | microstrip resonators |
dc.subject.other | microwave measurement |
dc.subject.other | penetration depth (superconductivity) |
dc.subject.other | superconducting cavity resonators |
dc.subject.other | superconducting device testing |
dc.title | Accuracy considerations in microstrip surface impedance measurements |
dc.type | Article |
dc.subject.lemac | Resonadors dielèctrics |
dc.subject.lemac | Superconductivitat |
dc.subject.lemac | Impedància (Electricitat) |
dc.subject.lemac | Microones -- Mesurament |
dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Open Access |
local.personalitzacitacio | true |
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