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dc.contributor.authorMassolino, Pedro Maat C.
dc.contributor.authorEge, Baris
dc.contributor.authorBatina, Lejla
dc.coverage.spatialeast=2.11563799999999; north=41.38479239999999; name=Zona Universitària-Escola T S d'Enginyers, 08028 Barcelona, Espanya
dc.description.abstractPower and clock glitch attacks on smart cards can help an attacker to discover some internal secrets or bypass certain security checks. Also, an attacker can manipulate the temperature and supply voltage of the device, thus making the device glitch more easily. If these manipulations are within the device operating conditions, it becomes harder to distinguish between an extreme condition from an attacker. To demonstrate temperature and power supply effect on fault attacks, we perform several tests on an Atmega 163 microcontroller in different conditions. Our results show that this kind of attacks are still a serious threat to small devices, whilst maintaining the manufacturer recommendations.
dc.format.extent6 p.
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshEmbedded computer systems--Congresses
dc.subject.lcshIntegrated circuits
dc.subject.lcshComputer networks--Security measures
dc.titleSmart Card Fault Injections with High Temperatures
dc.typeConference report
dc.subject.lemacSistemes integrats -- Congressos
dc.subject.lemacCircuits integrats
dc.subject.lemacSeguretat informàtica -- Congressos
dc.rights.accessOpen Access

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Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain