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Smart Card Fault Injections with High Temperatures

Cita com:
hdl:2117/99293
Document typeConference report
Defense date2016-11-15
Rights accessOpen Access
This work is protected by the corresponding intellectual and industrial property rights.
Except where otherwise noted, its contents are licensed under a Creative Commons license
:
Attribution-NonCommercial-NoDerivs 3.0 Spain
Abstract
Power and clock glitch attacks on smart cards can help an attacker to discover some internal
secrets or bypass certain security checks. Also, an attacker can manipulate the temperature and supply voltage
of the device, thus making the device glitch more easily. If these manipulations are within the device operating
conditions, it becomes harder to distinguish between an extreme condition from an attacker. To demonstrate
temperature and power supply effect on fault attacks, we perform several tests on an Atmega 163 microcontroller
in different conditions. Our results show that this kind of attacks are still a serious threat to small devices,
whilst maintaining the manufacturer recommendations.
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FCTRU_2016_17_Smart_Card_Fault.pdf | 1,119Mb | View/Open |