Smart Card Fault Injections with High Temperatures
Visualitza/Obre
Estadístiques de LA Referencia / Recolecta
Inclou dades d'ús des de 2022
Cita com:
hdl:2117/99293
Tipus de documentText en actes de congrés
Data publicació2016-11-15
Condicions d'accésAccés obert
Llevat que s'hi indiqui el contrari, els
continguts d'aquesta obra estan subjectes a la llicència de Creative Commons
:
Reconeixement-NoComercial-SenseObraDerivada 3.0 Espanya
Abstract
Power and clock glitch attacks on smart cards can help an attacker to discover some internal
secrets or bypass certain security checks. Also, an attacker can manipulate the temperature and supply voltage
of the device, thus making the device glitch more easily. If these manipulations are within the device operating
conditions, it becomes harder to distinguish between an extreme condition from an attacker. To demonstrate
temperature and power supply effect on fault attacks, we perform several tests on an Atmega 163 microcontroller
in different conditions. Our results show that this kind of attacks are still a serious threat to small devices,
whilst maintaining the manufacturer recommendations.
Fitxers | Descripció | Mida | Format | Visualitza |
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FCTRU_2016_17_Smart_Card_Fault.pdf | 1,119Mb | Visualitza/Obre |