Accuracy considerations in microstrip surface impedance measurements

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O'Callaghan Castellà, Juan ManuelMés informacióMés informacióMés informació
Collado Gómez, Juan CarlosMés informacióMés informacióMés informació
Pous Andrés, Rafael
Document typeArticle
Defense date1997-06-30
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Rights accessOpen Access
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Abstract
CitationO'Callaghan, J.; Sans, C; Collado, C; Canet, E; Pous, R; Fontcuberta, J. Accuracy considerations in microstrip surface impedance measurements. IEEE Transactions on applied superconductivity, 1997, vol. 7, núm 2, p. 1869-1872. 
URIhttp://hdl.handle.net/2117/992
ISSN1051-8223
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