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Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges
dc.contributor.author | Nguyen, T. D. |
dc.contributor.author | O'Callaghan Castellà, Juan Manuel |
dc.contributor.author | Davidson, B. A. |
dc.contributor.author | Redwing, R. D. |
dc.contributor.author | Hohenwarter, G. K. G. |
dc.contributor.author | Nordman, J. E. |
dc.contributor.author | Beyer, J. B. |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
dc.date.accessioned | 2007-05-14T08:55:10Z |
dc.date.available | 2007-05-14T08:55:10Z |
dc.date.created | 1994 |
dc.date.issued | 1995-01-31 |
dc.identifier.citation | Nguyen, T.; O'Callaghan, J. M.; Davidson, B. A.; Redwing, R. D.; Hohenwarter, G. K. G.; Nordman, J. E.; Beyer, J. B.; Mechanisms for conduction via low-frequency noise measurements of high-Tc/sub c/thin film microbridges. IEEE Transactions on applied superconductivity, 1995, vol. 5, núm. 2, p. 3369-3372. |
dc.identifier.issn | 1051-8223 |
dc.identifier.uri | http://hdl.handle.net/2117/991 |
dc.description.abstract | We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage. |
dc.format.extent | 3369-3372 |
dc.language.iso | eng |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
dc.subject.lcsh | High temperature superconductors |
dc.subject.lcsh | Superconductivity |
dc.subject.other | 1/f noise |
dc.subject.other | barium compounds |
dc.subject.other | flux flow |
dc.subject.other | flux pinning |
dc.subject.other | high-temperature superconductors |
dc.subject.other | superconducting device noise |
dc.subject.other | superconducting device testing |
dc.subject.other | superconducting microbridges |
dc.subject.other | superconducting thin films |
dc.subject.other | yttrium compounds |
dc.title | Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges |
dc.type | Article |
dc.subject.lemac | Superconductors a altes temperatures |
dc.subject.lemac | Superconductivitat |
dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Open Access |
local.identifier.drac | 1654642 |
local.personalitzacitacio | true |
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