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dc.contributor.authorJames, P. M.
dc.contributor.authorO'Callaghan Castellà, Juan Manuel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2007-05-14T08:45:04Z
dc.date.available2007-05-14T08:45:04Z
dc.date.created1992
dc.date.issued1993-03-31
dc.identifier.citationJames, P. M.; O'Callaghan, J. M.; Application of selective leaching in fabrication of thin film YBCO devices. IEEE Transactions on applied superconductivity, 1993, vol. 3, núm. 1, p. 2972-2974.
dc.identifier.issn1051-8223
dc.identifier.urihttp://hdl.handle.net/2117/988
dc.description.abstractEthylenediamine solutions have been shown to turn bulk YBCO into insulating materials. The effect of these solutions on thin YBCO films is studied. In both unpatterned and patterned films, a smooth decrease in critical currents, a transition to normal state, and a subsequent gradual increase in resistance are observed as a function of exposure time to the solution. It is noted that these characteristics might make this process desirable for weak-link and on-film resistor fabrication.
dc.format.extent2972-2974
dc.language.isoeng
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
dc.subject.lcshHigh temperature superconductors
dc.subject.lcshCritical currents
dc.subject.otherbarium compounds
dc.subject.othercritical currents
dc.subject.otherdissolving
dc.subject.otherhigh-temperature superconductors
dc.subject.othersuperconducting junction devices
dc.subject.othersuperconducting thin films
dc.subject.otheryttrium compounds
dc.titleApplication of selective leaching in fabrication of thin film ybco devices
dc.typeArticle
dc.subject.lemacCorrent elèctric
dc.subject.lemacSuperconductors a altes temperatures
dc.contributor.groupUniversitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access


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