Mostra el registre d'ítem simple
An alternative characterization method of PFET sub-threshold slope under NBTI stress
dc.contributor.author | Fernández García, Raúl |
dc.contributor.author | Gil Galí, Ignacio |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2010-10-20T14:50:39Z |
dc.date.available | 2010-10-20T14:50:39Z |
dc.date.created | 2010 |
dc.date.issued | 2010 |
dc.identifier.citation | Fernandez, R.; Gil, I. An alternative characterization method of PFET sub-threshold slope under NBTI stress. A: European Solid State Device Research Conference. "ESSDERC". Sevilla: 2010. |
dc.identifier.uri | http://hdl.handle.net/2117/9865 |
dc.description.abstract | The effects of negative bias temperature instability (NBTI) on the sub-threshold performance of a pFET have been investigated by means of experimental methods. Specifically, the sub-threshold slope under static and dynamic NBTI stress has been characterized for different NBTI stress conditions. In order to perform the characterization, a proposal based on an alternative measurement technique to obtain the sub-threshold slope is presented. Our first results indicate that similar sub-threshold slope is obtained in all stress conditions. |
dc.format.extent | 1 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència |
dc.subject.lcsh | Electromagnetic interference |
dc.subject.lcsh | Switching power supplies |
dc.title | An alternative characterization method of PFET sub-threshold slope under NBTI stress |
dc.type | Conference lecture |
dc.subject.lemac | Interferència electromàgnetica |
dc.subject.lemac | Fonts d'alimentació |
dc.contributor.group | Universitat Politècnica de Catalunya. (TIEG) - Terrassa Industrial Electronics Group |
dc.rights.access | Open Access |
local.identifier.drac | 2754958 |
dc.description.version | Postprint (published version) |
local.citation.author | Fernandez, R.; Gil, I. |
local.citation.contributor | European Solid State Device Research Conference |
local.citation.pubplace | Sevilla |
local.citation.publicationName | ESSDERC |