Extraction of noise parameters of transistor using a spectrum analyser and 50 /spl Theta/ noise figure measurements only

Lázaro Guillén, Antoni; Pradell i Cara, Lluís

doi:10.1049/el:19981592

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Lázaro Guillén, Antoni

Pradell i Cara, Lluís

Document typeArticle

Defense date1998-11

PublisherInstitution of Electrical Engineers

Rights accessOpen Access

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder

Abstract

A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 /spl Theta/ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost.

CitationLazaro, A., Pradell, L. Extraction of noise parameters of transistor using a spectrum analyser and 50 /spl Theta/ noise figure measurements only. "Electronics Letters", Novembre 1998, vol. 34, núm. 24, p. 2353-2354.

URIhttp://hdl.handle.net/2117/98027

DOI10.1049/el:19981592

ISSN0013-5194

Publisher versionhttp://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/document/743045/

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