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Temperature sensors and measurements to test analogue circuits: questions and answers

dc.contributor.authorAltet Sanahujes, Josep
dc.contributor.authorRubio Sola, Jose Antonio
dc.contributor.authorReverter Cubarsí, Ferran
dc.contributor.authorPerpiñà Gilabet, Xavier
dc.contributor.authorAragonès Cervera, Xavier
dc.contributor.authorJordà, Xavier
dc.contributor.authorVellvehi, Miquel
dc.contributor.authorMateo Peña, Diego
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2016-11-23T15:13:26Z
dc.date.issued2016
dc.identifier.citationAltet, J., Rubio, A., Reverter, F., Perpiñà, X., Aragones, X., Jordà, X., Vellvehi, M., Mateo, D. Temperature sensors and measurements to test analogue circuits: questions and answers. A: International Mixed-Signal Testing Workshop. "2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016.
dc.identifier.isbn978-1-5090-2751-4
dc.identifier.urihttp://hdl.handle.net/2117/97135
dc.description.abstractWe have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many interesting questions, some of them collected more than once!. Here you have some of them. Our goal in this paper is to introduce temperature measurements and temperature sensors to test analog circuits from the highest level of abstraction. This paper has been written with the goal to provide basic understanding and present some of the possibilities of temperature sensors and measurements to test integrated circuits in general, analog in particular.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors
dc.subject.lcshIntegrated circuits
dc.subject.lcshTemperature measurements
dc.subject.otherAnalogue circuits
dc.subject.otherIntegrated circuit testing
dc.subject.otherTemperature measurement
dc.subject.otherTemperature sensors
dc.subject.otherTemperature sensors
dc.subject.otherAnalogue circuits
dc.subject.otherTemperature measurements
dc.subject.otherIntegrated circuits
dc.titleTemperature sensors and measurements to test analogue circuits: questions and answers
dc.typeConference report
dc.subject.lemacCircuits integrats
dc.subject.lemacTermometria
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.contributor.groupUniversitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics
dc.identifier.doi10.1109/IMS3TW.2016.7524241
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/stamp/stamp.jsp?arnumber=7524241
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac18850890
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorAltet, J.; Rubio, A.; Reverter, F.; Perpiñà, X.; Aragones, X.; Jordà, X.; Vellvehi, M.; Mateo, D.
local.citation.contributorInternational Mixed-Signal Testing Workshop
local.citation.pubplaceSant Feliu de Guixols, Barcelona
local.citation.publicationName2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016


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