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Improving indirect test efficiency using multi-directional tessellations in the measure space
dc.contributor.author | Gómez Pau, Álvaro |
dc.contributor.author | Balado Suárez, Luz María |
dc.contributor.author | Figueras Pàmies, Joan |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2016-11-23T14:49:27Z |
dc.date.issued | 2016 |
dc.identifier.citation | Álvaro Gómez-Pau, Balado, L., Figueras, J. Improving indirect test efficiency using multi-directional tessellations in the measure space. A: International Mixed-Signal Testing Workshop. "2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 1-6. |
dc.identifier.isbn | 978-1-5090-2751-4 |
dc.identifier.uri | http://hdl.handle.net/2117/97134 |
dc.description.abstract | Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the possibilities of using multidirectional tessellations in the indirect measure space aiming to reduce false positive test outcomes. The key idea of the proposal is to use several rotated 2n-ary trees in order to tessellate and encode the indirect measure space along multiple directions. Such tessellations create a refinement in the highly non linear test decision boundary without the need of including more circuit samples within the training set. The trained trees, together with a strict test decision criterion, serve as a classifier during the production testing phase. The proposed multi-directional tessellation methodology has been applied to test a Biquad filter under the presence of parametric variations. Promising simulation results report considerable improvements in lowering test escape metrics by an average factor of 50 as compared to a single octree tessellation as well as low computational overhead. |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Informàtica |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació |
dc.subject.lcsh | Data structures (Computer science) |
dc.subject.lcsh | Electronic data processing |
dc.subject.other | Biquadratic filters |
dc.subject.other | Production testing |
dc.subject.other | Trees (mathematics) |
dc.subject.other | Indirect test efficiency |
dc.subject.other | Multidirectional tessellations |
dc.subject.other | Indirect measure space |
dc.subject.other | False positive test outcome reduction |
dc.subject.other | Rotated 2n-ary trees |
dc.subject.other | Nonlinear test decision boundary |
dc.subject.other | Strict test decision criterion |
dc.subject.other | Production testing phase |
dc.subject.other | Biquad filter |
dc.subject.other | Parametric variations |
dc.title | Improving indirect test efficiency using multi-directional tessellations in the measure space |
dc.type | Conference report |
dc.subject.lemac | Estructures de dades (Informàtica) |
dc.subject.lemac | Informàtica |
dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.identifier.doi | 10.1109/IMS3TW.2016.7524230 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://ieeexplore.ieee.org/document/7524230/ |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 18825295 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Gómez-Pau, Álvaro; Balado, L.; Figueras, J. |
local.citation.contributor | International Mixed-Signal Testing Workshop |
local.citation.pubplace | Sant Feliu de Guixols, Barcelona |
local.citation.publicationName | 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016 |
local.citation.startingPage | 1 |
local.citation.endingPage | 6 |