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Improving indirect test efficiency using multi-directional tessellations in the measure space

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10.1109/IMS3TW.2016.7524230
 
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hdl:2117/97134

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Gómez Pau, ÁlvaroMés informacióMés informacióMés informació
Balado Suárez, Luz MaríaMés informacióMés informació
Figueras Pàmies, JoanMés informació
Document typeConference report
Defense date2016
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessRestricted access - publisher's policy
Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain
Abstract
Indirect test strategies have risen as a promising solution to overcome the challenges encountered in analog and mixed-signal circuit testing and the ever increasing device verification costs. This work explores the possibilities of using multidirectional tessellations in the indirect measure space aiming to reduce false positive test outcomes. The key idea of the proposal is to use several rotated 2n-ary trees in order to tessellate and encode the indirect measure space along multiple directions. Such tessellations create a refinement in the highly non linear test decision boundary without the need of including more circuit samples within the training set. The trained trees, together with a strict test decision criterion, serve as a classifier during the production testing phase. The proposed multi-directional tessellation methodology has been applied to test a Biquad filter under the presence of parametric variations. Promising simulation results report considerable improvements in lowering test escape metrics by an average factor of 50 as compared to a single octree tessellation as well as low computational overhead.
CitationÁlvaro Gómez-Pau, Balado, L., Figueras, J. Improving indirect test efficiency using multi-directional tessellations in the measure space. A: International Mixed-Signal Testing Workshop. "2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW 2016): Sant Feliu de Guixols, Spain: 4-6 July 2016". Sant Feliu de Guixols, Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2016, p. 1-6. 
URIhttp://hdl.handle.net/2117/97134
DOI10.1109/IMS3TW.2016.7524230
ISBN978-1-5090-2751-4
Publisher versionhttp://ieeexplore.ieee.org/document/7524230/
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  • QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat - Ponències/Comunicacions de congressos [78]
  • Departament d'Enginyeria Electrònica - Ponències/Comunicacions de congressos [1.679]
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