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dc.contributor.authorKichou, Sofiane
dc.contributor.authorSilvestre Bergés, Santiago
dc.contributor.authorNofuentes Garrido, Gustavo
dc.contributor.authorTorres Ramírez, Miguel
dc.contributor.authorChouder, Aissa
dc.contributor.authorGuasch Murillo, Daniel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Telemàtica
dc.date.accessioned2016-07-14T11:19:01Z
dc.date.available2016-07-14T11:19:01Z
dc.date.issued2016-06-01
dc.identifier.citationKichou, S., Silvestre, S., Nofuentes Garrido, Gustavo, Torres-Ramirez, M., Chouder, A., Guasch, D. Behavioral data of thin-film single junction amorphous silicon (a-Si) photovoltaic modules under outdoor long term exposure. "Data in Brief", 01 Juny 2016, vol. 7, p. 366-371.
dc.identifier.issn2352-3409
dc.identifier.urihttp://hdl.handle.net/2117/88794
dc.description.abstractFour years'behavioraldataofthin-film single junction amorphous silicon (a-Si)photovoltaic(PV)modules installed in a relatively dry and sunny inland site with aContinental-Mediterranean climate (in thecityofJaén,Spain)are presented in this article.The shared data contributes to clarify how the Light Induced Degradation(LID) impacts the output power generated by the PV array,especially in the first days of exposure under outdoor conditions. Furthermore, a valuable methodology is provided in this data article permitting the assessment of the degradation rate and the stabilization period of theP V modules. Further discussions an dinterpretations concerning the data shared in this article can be found in ter esearch paper “Char- acterization of degradation and evaluation of model parameters of amorphous silicon photovoltaic modules under outdoor long term exposure” (Kichou etal.,2016) [1].
dc.format.extent6 p.
dc.language.isoeng
dc.publisherElsevier
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Energies
dc.subject.lcshPhotovoltaic power generation
dc.subject.otherLight-induced degradation(LID)
dc.subject.othera-Si PVmodules
dc.subject.otherStabilization period
dc.subject.otherPhotovoltaic systems
dc.subject.othera-Si PV module degradation analysis
dc.titleBehavioral data of thin-film single junction amorphous silicon (a-Si) photovoltaic modules under outdoor long term exposure
dc.typeArticle
dc.subject.lemacEnergia fotovoltaica -- Generació
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.contributor.groupUniversitat Politècnica de Catalunya. BAMPLA - Disseny i Avaluació de Xarxes i Serveis de Banda Ampla
dc.identifier.doi10.1016/j.dib.2016.02.055
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S2352340916300774
dc.rights.accessOpen Access
local.identifier.drac17678668
dc.description.versionPostprint (published version)
local.citation.authorKichou, S.; Silvestre, S.; Nofuentes Garrido, Gustavo; Torres-Ramirez, M.; Chouder, A.; Guasch, D.
local.citation.publicationNameData in Brief
local.citation.volume7
local.citation.startingPage366
local.citation.endingPage371


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Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution 3.0 Spain