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dc.contributor.authorReverter Cubarsí, Ferran
dc.contributor.authorPerpinyà, Xavier
dc.contributor.authorLeon, Javier
dc.contributor.authorVellvehi, Miquel
dc.contributor.authorJordà, Xavier
dc.contributor.authorAltet Sanahujes, Josep
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2016-05-06T10:23:59Z
dc.date.available2016-05-06T10:23:59Z
dc.date.issued2015
dc.identifier.citationReverter, F., Perpinyà, X., Leon, J., Vellvehi, M., Jordà, X., Altet, J. Characterization of MOSFET temperature sensors for on-chip dynamic thermal measurements. A: Eurosensors. "Procedia Engineering". 2015, p. 836-839.
dc.identifier.urihttp://hdl.handle.net/2117/86682
dc.format.extent4 p.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshDetectors
dc.subject.otherIC testing
dc.subject.otherMOSFET
dc.subject.othertemperature sensor
dc.subject.otherthermal coupling
dc.subject.otherthermal testing
dc.titleCharacterization of MOSFET temperature sensors for on-chip dynamic thermal measurements
dc.typeConference lecture
dc.subject.lemacDetectors
dc.contributor.groupUniversitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.identifier.doi10.1016/j.proeng.2015.08.699
dc.rights.accessOpen Access
drac.iddocument16940796
dc.description.versionPostprint (published version)
upcommons.citation.authorReverter, F., Perpinyà, X., Leon, J., Vellvehi, M., Jordà, X., Altet, J.
upcommons.citation.contributorEurosensors
upcommons.citation.publishedtrue
upcommons.citation.publicationNameProcedia Engineering
upcommons.citation.startingPage836
upcommons.citation.endingPage839


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