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dc.contributor.authorCuadras Tomàs, Àngel
dc.contributor.authorCrisóstomo, Javier
dc.contributor.authorOvejas Benedicto, Victòria Júlia
dc.contributor.authorQuílez Figuerola, Marcos
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2016-05-04T09:08:43Z
dc.date.available2016-05-04T09:08:43Z
dc.date.issued2015-10-28
dc.identifier.citationCuadras, A., Crisóstomo, J., Ovejas, V.J., Quilez, M. Irreversible entropy model for damage diagnosis in resistors. "Journal of applied physics", 28 Octubre 2015, vol. 118.
dc.identifier.issn0021-8979
dc.identifier.urihttp://hdl.handle.net/2117/86549
dc.description.abstractWe propose a method to characterize electrical resistor damage based on entropy measurements. Irreversible entropy and the rate at which it is generated are more convenient parameters than resistance for describing damage because they are essentially positive in virtue of the second law of thermodynamics, whereas resistance may increase or decrease depending on the degradation mechanism. Commercial resistors were tested in order to characterize the damage induced by power surges. Resistors were biased with constant and pulsed voltage signals, leading to power dissipation in the range of 4–8 W, which is well above the 0.25W nominal power to initiate failure. Entropy was inferred from the added power and temperature evolution. A model is proposed to understand the relationship among resistance, entropy, and damage. The power surge dissipates into heat (Joule effect) and damages the resistor. The results show a correlation between entropy generation rate and resistor failure. We conclude that damage can be conveniently assessed from irreversible entropy generation. Our results for resistors can be easily extrapolated to other systems or machines that can be modeled based on their resistance
dc.language.isoeng
dc.publisherAmerican Institute of Physics (AIP)
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectric resistors
dc.subject.otherentropy
dc.subject.otherdamage
dc.subject.otheraging
dc.subject.otherdegradation
dc.subject.otherresistor
dc.titleIrreversible entropy model for damage diagnosis in resistors
dc.typeArticle
dc.subject.lemacResistors
dc.contributor.groupUniversitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies
dc.identifier.doi10.1063/1.4934740
dc.relation.publisherversionhttp://dx.doi.org/10.1063/1.4934740
dc.rights.accessOpen Access
local.identifier.drac17370134
dc.description.versionPostprint (author's final draft)
local.citation.authorCuadras, A.; Crisóstomo, J.; Ovejas, V.J.; Quilez, M.
local.citation.publicationNameJournal of applied physics
local.citation.volume118
local.citation.startingPage165103


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