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A General approach for the calculation of intermodulation distortion in cavities with superconducting endplates

dc.contributor.authorMateu Mateu, Jordi
dc.contributor.authorCollado Gómez, Juan Carlos
dc.contributor.authorMenéndez, O
dc.contributor.authorO'Callaghan Castellà, Juan Manuel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2016-04-28T12:02:43Z
dc.date.available2016-04-28T12:02:43Z
dc.date.issued2003-01
dc.identifier.citationMateu, J., Collado, J., Menéndez, O., O'callaghan, J. A General approach for the calculation of intermodulation distortion in cavities with superconducting endplates. "Applied physics letters", Gener 2003, vol. 82, núm. 1, p. 97-99.
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/2117/86367
dc.description.abstractWe report on a general procedure to calculate intermodulation distortion in cavities with superconducting endplates that is applicable to the dielectric-loaded cavities currently used for measurement of surface resistance in high-temperature superconductors. The procedure would enable the use such cavities for intermodulation characterization of unpatterned superconducting films, and would remove the uncertainty of measuring intermodulation on patterned devices, in which the effect of patterning damage might influence the outcome of the measurements. We have verified the calculation method by combining superconducting and copper endplates in a rutile-loaded cavity
dc.format.extent3 p.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject.lcshMicrowaves
dc.titleA General approach for the calculation of intermodulation distortion in cavities with superconducting endplates
dc.typeArticle
dc.subject.lemacMicroones
dc.contributor.groupUniversitat Politècnica de Catalunya. CSC - Components and Systems for Communications Research Group
dc.contributor.groupUniversitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://hdl.handle.net/2117/1121
dc.rights.accessOpen Access
local.identifier.drac1654726
dc.description.versionPostprint (published version)
local.citation.authorMateu, J.; Collado, J.; Menéndez, O.; O'callaghan, J.
local.citation.publicationNameApplied physics letters
local.citation.volume82
local.citation.number1
local.citation.startingPage97
local.citation.endingPage99


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