Mostra el registre d'ítem simple
Direct extraction of all four transistor noise parameters from 50 noise figure measurements
dc.contributor.author | Lázaro Guillén, Antoni |
dc.contributor.author | Pradell i Cara, Lluís |
dc.contributor.author | Beltrán, A |
dc.contributor.author | O'Callaghan Castellà, Juan Manuel |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
dc.date.accessioned | 2016-04-28T07:47:06Z |
dc.date.available | 2016-04-28T07:47:06Z |
dc.date.issued | 1998-02 |
dc.identifier.citation | Lazaro, A., Pradell, L., Beltrán, A., O'callaghan, J. Direct extraction of all four transistor noise parameters from 50 noise figure measurements. "Electronics Letters", Febrer 1998, vol. 34, núm. 3, p. 289-291. |
dc.identifier.issn | 0013-5194 |
dc.identifier.uri | http://hdl.handle.net/2117/86306 |
dc.description.abstract | A new method for measuring the four noise parameters (NPs) of a transistor is presented. It is based on the determination of its intrinsic noise matrix elements (C, ,INT, C,,7NT, Re(C,, |
dc.format.extent | 3 p. |
dc.language.iso | eng |
dc.publisher | Institution of Electrical Engineers |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Electronics |
dc.title | Direct extraction of all four transistor noise parameters from 50 noise figure measurements |
dc.type | Article |
dc.subject.lemac | Electrònica |
dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Open Access |
local.identifier.drac | 1635273 |
dc.description.version | Postprint (published version) |
local.citation.author | Lazaro, A.; Pradell, L.; Beltrán, A.; O'callaghan, J. |
local.citation.publicationName | Electronics Letters |
local.citation.volume | 34 |
local.citation.number | 3 |
local.citation.startingPage | 289 |
local.citation.endingPage | 291 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [2.494]
-
Articles de revista [200]