Direct extraction of all four transistor noise parameters from 50 noise figure measurements

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Lázaro Guillén, Antoni
Pradell i Cara, LluísMés informacióMés informacióMés informació
O'Callaghan Castellà, Juan ManuelMés informacióMés informacióMés informació
Document typeArticle
Defense date1998-02
PublisherInstitution of Electrical Engineers
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
CitationLazaro, A., Pradell, L., Beltrán, A., O'callaghan, J. Direct extraction of all four transistor noise parameters from 50 noise figure measurements. "Electronics Letters", Febrer 1998, vol. 34, núm. 3, p. 289-291. 
URIhttp://hdl.handle.net/2117/86306
ISSN0013-5194
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