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dc.contributor.authorO'Callaghan Castellà, Juan Manuel
dc.contributor.authorSans, C
dc.contributor.authorPous Andrés, Rafael
dc.contributor.authorCollado Gómez, Juan Carlos
dc.contributor.authorCanet, E
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2016-04-28T07:21:57Z
dc.date.available2016-04-28T07:21:57Z
dc.date.issued1997-06
dc.identifier.citationO'callaghan, J., Sans, C., Pous, R., Collado, J., Canet, E. Accuracy considerations in surface impedance measurements. "IEEE transactions on applied superconductivity", Juny 1997, vol. 7, núm. 2, p. 1869-1872.
dc.identifier.issn1051-8223
dc.identifier.urihttp://hdl.handle.net/2117/86303
dc.description.abstractAn approach is proposied for the design, measurement and data extraction of superconducting microstrip resonators used in determination of surface resistance and penetration depth. Major sources of error are analyzed and procedures to minimize them are given.
dc.format.extent4 p.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectronics
dc.titleAccuracy considerations in surface impedance measurements
dc.typeArticle
dc.subject.lemacElectrònica
dc.contributor.groupUniversitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.contributor.groupUniversitat Politècnica de Catalunya. CSC - Components and Systems for Communications Research Group
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
local.identifier.drac1655059
dc.description.versionPostprint (published version)
local.citation.authorO'callaghan, J.; Sans, C.; Pous, R.; Collado, J.; Canet, E.
local.citation.publicationNameIEEE transactions on applied superconductivity
local.citation.volume7
local.citation.number2
local.citation.startingPage1869
local.citation.endingPage1872


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