Mostra el registre d'ítem simple
Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge
dc.contributor.author | Domínguez Pumar, Manuel |
dc.contributor.author | Gorreta Mariné, Sergio |
dc.contributor.author | Pons Nin, Joan |
dc.contributor.author | Gomez Rodriguez, Faustino |
dc.contributor.author | Gonzalez Castaño, Diego |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2016-03-04T15:28:29Z |
dc.date.available | 2017-07-04T00:30:36Z |
dc.date.issued | 2015-07-03 |
dc.identifier.citation | Dominguez, M., Gorreta, S., Pons, J., Gomez, F., Gonzalez, D. Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge. "Microelectronics reliability", 03 Juliol 2015, vol. 55, núm. 9-10, p. 1926-1931. |
dc.identifier.issn | 0026-2714 |
dc.identifier.uri | http://hdl.handle.net/2117/83849 |
dc.description.abstract | The purpose of this paper is to show that the charge induced by radiation in a dielectric on which a sigma–delta control of dielectric charge is implemented, can be seen as a disturbance in a sliding mode controller. Preliminary experimental results are presented in which a MEMS device is irradiated with X-rays, while the dielectric charge control is continuously being monitored. The charge induced by radiation generates a change in the control bitstream, which is associated with the presence of an external disturbance on the governing control equations. |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject.lcsh | Microelectronics |
dc.subject.lcsh | Dielectrics |
dc.subject.other | Dielectric charge control |
dc.subject.other | Sliding mode control |
dc.subject.other | Charge trapping |
dc.subject.other | Ionizing radiation |
dc.title | Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge |
dc.type | Article |
dc.subject.lemac | Microelectrònica |
dc.subject.lemac | Dielèctrics |
dc.contributor.group | Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies |
dc.identifier.doi | 10.1016/j.microrel.2015.06.084 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://www.sciencedirect.com/science/article/pii/S0026271415001766 |
dc.rights.access | Open Access |
local.identifier.drac | 17506184 |
dc.description.version | Postprint (author's final draft) |
local.citation.author | Dominguez, M.; Gorreta, S.; Pons, J.; Gomez, F.; Gonzalez, D. |
local.citation.publicationName | Microelectronics reliability |
local.citation.volume | 55 |
local.citation.number | 9-10 |
local.citation.startingPage | 1926 |
local.citation.endingPage | 1931 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [346]
-
Articles de revista [1.723]