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dc.contributor.authorDomínguez Pumar, Manuel
dc.contributor.authorGorreta Mariné, Sergio
dc.contributor.authorPons Nin, Joan
dc.contributor.authorGomez Rodriguez, Faustino
dc.contributor.authorGonzalez Castaño, Diego
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2016-03-04T15:28:29Z
dc.date.available2017-07-04T00:30:36Z
dc.date.issued2015-07-03
dc.identifier.citationDominguez, M., Gorreta, S., Pons, J., Gomez, F., Gonzalez, D. Charge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge. "Microelectronics reliability", 03 Juliol 2015, vol. 55, núm. 9-10, p. 1926-1931.
dc.identifier.issn0026-2714
dc.identifier.urihttp://hdl.handle.net/2117/83849
dc.description.abstractThe purpose of this paper is to show that the charge induced by radiation in a dielectric on which a sigma–delta control of dielectric charge is implemented, can be seen as a disturbance in a sliding mode controller. Preliminary experimental results are presented in which a MEMS device is irradiated with X-rays, while the dielectric charge control is continuously being monitored. The charge induced by radiation generates a change in the control bitstream, which is associated with the presence of an external disturbance on the governing control equations.
dc.format.extent6 p.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject.lcshMicroelectronics
dc.subject.lcshDielectrics
dc.subject.otherDielectric charge control
dc.subject.otherSliding mode control
dc.subject.otherCharge trapping
dc.subject.otherIonizing radiation
dc.titleCharge induced by ionizing radiation understood as a disturbance in a sliding mode control of dielectric charge
dc.typeArticle
dc.subject.lemacMicroelectrònica
dc.subject.lemacDielèctrics
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1016/j.microrel.2015.06.084
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0026271415001766
dc.rights.accessOpen Access
drac.iddocument17506184
dc.description.versionPostprint (author's final draft)
upcommons.citation.authorDominguez, M., Gorreta, S., Pons, J., Gomez, F., Gonzalez, D.
upcommons.citation.publishedtrue
upcommons.citation.publicationNameMicroelectronics reliability
upcommons.citation.volume55
upcommons.citation.number9-10
upcommons.citation.startingPage1926
upcommons.citation.endingPage1931


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