One of the most promising emerging technologies is based on the use of memristive devices. Although capable of implementing certain type of logic circuits, they are being extensively used for memory applications. Beside memristor advantages such as high scalability, their drawbacks including manufacturing process variability and limited read/write endurance, could risk their future utilization. In this work we propose an implementation of a proactive reconfiguration strategy alongside a testing procedure to detect the weakest memory cells inside the crossbar. Such a realization can extend the crossbar lifetime.