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Influence of punch trough stop layer and well depths on the robustness of bulk FinFETs to heavy ions impact
(Institute of Electrical and Electronics Engineers (IEEE), 2022-05-02)
Article
Open AccessThis study analyzes the effects of the punch-through stop (PTS) layer and well depth in a bulk FinFET SRAM cell on the fraction of charge generated by an ion impact that is collected by the FinFET channel. More than 1700 ... -
On-line remaining useful life estimation of power connectors focused on predictive maintenance
(Multidisciplinary Digital Publishing Institute (MDPI), 2021-05-27)
Article
Open AccessConnections are critical elements in power systems, exhibiting higher failure probability. Power connectors are considered secondary simple devices in power systems despite their key role, since a failure in one such element ... -
RRAM random number generator based on train of pulses
(2021-07-30)
Article
Open AccessIn this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude ... -
Serial RRAM cell for secure bit concealing
(2021-07-31)
Article
Open AccessNon-volatile memory cells are exposed to adversary attacks since any active countermeasure is useless when the device is powered off. In this context, this work proposes the association of two serial RRAM devices as a basic ... -
Enhanced serial RRAM cell for unpredictable bit generation
(2021-05)
Article
Open AccessIn this letter, the serial configuration of two RRAMs is used as a basic cell to generate an unpredictable bit. The basis of the operation considers starting from the Low Resistive State (LRS) in both devices (initialization ... -
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures
(2020-08-01)
Article
Open AccessAlternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively ... -
A forming-free ReRAM cell with low operating voltage
(2020-11-25)
Article
Open AccessThe unwanted electro-forming process is unavoidable for the practical application of most resistive random access memory (ReRAM) devices, which is always being one of the obstacles for the massive commercialization of this ... -
Sensor comparison for corona discharge detection under low pressure conditions
(2020-06-01)
Article
Open AccessLow pressure environments, situate insulation systems in a challenging position since partial discharges (PDs), corona and arc tracking are more likely to develop. Therefore, specific solutions are required to detect such ... -
Uprating of transmission lines by means of HTLS conductors for a sustainable growth: challenges, opportunities, and research needs
(2020-12-01)
Article
Open AccessThis paper provides a comprehensive and critical review and evaluation of the technological state-of-the-art of high-temperature low-sag (HTLS) conductors by analyzing research articles, theses, reports, white papers and ... -
Arc tracking control in insulation systems for aeronautic applications: challenges, opportunities, and research needs
(Multidisciplinary Digital Publishing Institute (MDPI), 2020-03-16)
Article
Open AccessNext generation aircrafts will use more electrical power to reduce weight, fuel consumption, system complexity and greenhouse gas emissions. However, new failure modes and challenges arise related to the required voltage ... -
Impact of laser attacks on the switching behavior of RRAM devices
(2020-01-20)
Article
Open AccessThe ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative ... -
Experimental study of visual corona under aeronautic pressure conditions using low-cost imaging sensors
(Multidisciplinary Digital Publishing Institute (MDPI), 2020-01-11)
Article
Open AccessVisual corona tests have been broadly applied for identifying the critical corona points of diverse high-voltage devices, although other approaches based on partial discharge or radio interference voltage measurements are ...