Recent Submissions

  • Postbond test of through-silicon vias with resistive open defects 

    Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan (2019-07-17)
    Article
    Open Access
    Through-silicon vias (TSVs) technology has attracted industry interest as a way to achieve high bandwidth, and short interconnect delays in nanometer three-dimensional integrated circuits (3-D ICs). However, TSVs are ...
  • A calibratable detector for invasive attacks 

    Weiner, Michael; Wieser, Wolfgang; Lupón Roses, Emilio; Sigl, Georg; Manich Bou, Salvador (2019-01-25)
    Article
    Restricted access - publisher's policy
    Microprobing is commonly used by adversaries to extract firmware or cryptographic keys from microcontrollers. We introduce the calibratable lightweight invasive attack detector (CaLIAD) to detect microprobing attacks. The ...
  • Unpredictable bits generation based on RRAM parallel configuration 

    Arumi Delgado, Daniel; Gómez Pau, Álvaro; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Bargalló, Mireia; Campabadal, Francesca (2018-12-12)
    Article
    Open Access
    In this letter a cell with the parallel combination of two TiN/Ti/HfO2/W resistive random access memory (RRAM) devices is studied for the generation of unpredictable bits. Measurements confirm that a simultaneous parallel ...
  • Redes de ordenadores, redes de sistemas, sistemas distribuidos 

    Alabau Muñoz, Antonio; Figueras Pàmies, Joan (Asociación de Técnicos de Informática, 1980-11)
    Article
    Open Access
  • SOLIDE: un sistema operativo multi-tarea distribuido en tiempo real para microcomputadores 

    Lupón Roses, Emilio (Asociación de Técnicos de Informática, 1978-05)
    Article
    Open Access
    Ultimamente se ha venido produciendo uno modularización en el campo de los microcomputadores, más significativa en el aspecto hardware que en el software. El SOLIDE, sistema operativo multi-tarea distribuido en tiempo real, ...
  • La concurrencia de sistemas basados en microcomputador 

    Alabau Muñoz, Antonio; Figueras Pàmies, Joan (Asociación de Técnicos de Informática, 1978-01)
    Article
    Open Access
  • The low area probing detector as a countermeasure against invasive attacks 

    Weiner, Michael; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Sigl, Georg (2017-11-07)
    Article
    Open Access
    Microprobing allows intercepting data from on-chip wires as well as injecting faults into data or control lines. This makes it a commonly used attack technique against security-related semiconductors, such as smart card ...
  • RRAM serial configuration for the generation of random bits 

    Arumi Delgado, Daniel; Gonzalez, Mireia B.; Campabadal, Francesca (2017-06-25)
    Article
    Open Access
  • Defending cache memory against cold-boot attacks boosted by power or EM radiation analysis 

    Neagu, Madalin; Manich Bou, Salvador (2017-04)
    Article
    Open Access
    Some algorithms running with compromised data select cache memory as a type of secure memory where data is confined and not transferred to main memory. However, cold-boot attacks that target cache memories exploit the data ...
  • Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2017-02-20)
    Article
    Restricted access - publisher's policy
    One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers ...
  • Indirect test of M-S circuits using multiple specification band guarding 

    Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan (2016-09-01)
    Article
    Open Access
    Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using ...
  • Test escapes of stuck-open faults caused by parasitic capacitances and leakage currents 

    Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras, Joan (2015-09-24)
    Article
    Open Access
    Intragate open defects are responsible for a significant percentage of defects in present technologies. A majority of these defects causes the logic gate to become stuck open, and this is why they are traditionally modeled ...

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