QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat: Enviaments recents
Ara es mostren els items 1-12 de 162
-
Quiescent current analysis and experimentation of defective CMOS circuits
(1992-12)
Article
Accés restringit per política de l'editorialPhysical defects widely encountered in today's CMOS processes (bridges, gate oxide short (gas) and floating gates) are modeled taking into account the topology of the defective circuit and the parameters of the technology. ... -
Influence of punch trough stop layer and well depths on the robustness of bulk FinFETs to heavy ions impact
(Institute of Electrical and Electronics Engineers (IEEE), 2022-05-02)
Article
Accés obertThis study analyzes the effects of the punch-through stop (PTS) layer and well depth in a bulk FinFET SRAM cell on the fraction of charge generated by an ion impact that is collected by the FinFET channel. More than 1700 ... -
Simulation of serial RRAM cell based on a Verilog-A compact model
(Institute of Electrical and Electronics Engineers (IEEE), 2021)
Text en actes de congrés
Accés restringit per política de l'editorialModel-based simulation is one of the effective methods of scientific research. The inherent variability of resistive switching mechanisms has been an obstacle for the massive commercial implementation of the resistive ... -
Low Cost AES Protection Against DPA Using Rolling Codes
(Curran Associates, Inc., 2021)
Text en actes de congrés
Accés restringit per política de l'editorialMany block cipher algorithms like AES are known to be weak against differential power analysis attacks (DPA) if the executing unit presents certain levels of information leakage, which is a common problem in microprocessors. ... -
On-line remaining useful life estimation of power connectors focused on predictive maintenance
(Multidisciplinary Digital Publishing Institute (MDPI), 2021-05-27)
Article
Accés obertConnections are critical elements in power systems, exhibiting higher failure probability. Power connectors are considered secondary simple devices in power systems despite their key role, since a failure in one such element ... -
RRAM random number generator based on train of pulses
(2021-07-30)
Article
Accés obertIn this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude ... -
Serial RRAM cell for secure bit concealing
(2021-07-31)
Article
Accés obertNon-volatile memory cells are exposed to adversary attacks since any active countermeasure is useless when the device is powered off. In this context, this work proposes the association of two serial RRAM devices as a basic ... -
Enhanced serial RRAM cell for unpredictable bit generation
(2021-05)
Article
Accés obertIn this letter, the serial configuration of two RRAMs is used as a basic cell to generate an unpredictable bit. The basis of the operation considers starting from the Low Resistive State (LRS) in both devices (initialization ... -
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures
(2020-08-01)
Article
Accés obertAlternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively ... -
A forming-free ReRAM cell with low operating voltage
(2020-11-25)
Article
Accés obertThe unwanted electro-forming process is unavoidable for the practical application of most resistive random access memory (ReRAM) devices, which is always being one of the obstacles for the massive commercialization of this ... -
Sensor comparison for corona discharge detection under low pressure conditions
(2020-06-01)
Article
Accés obertLow pressure environments, situate insulation systems in a challenging position since partial discharges (PDs), corona and arc tracking are more likely to develop. Therefore, specific solutions are required to detect such ... -
Uprating of transmission lines by means of HTLS conductors for a sustainable growth: challenges, opportunities, and research needs
(2020-12-01)
Article
Accés obertThis paper provides a comprehensive and critical review and evaluation of the technological state-of-the-art of high-temperature low-sag (HTLS) conductors by analyzing research articles, theses, reports, white papers and ...