Show simple item record

dc.contributor.authorBeltran Sanchidrian, Victòria
dc.contributor.authorSalvadó Cabré, Nativitat
dc.contributor.authorButi Papiol, Salvador
dc.contributor.authorCinque, Gianfelice
dc.contributor.authorWehbe, Katia
dc.contributor.authorPradell Cara, Trinitat
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Química
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Física
dc.identifier.citationBeltran, V., Salvadó, N., Butí, S., Cinque, G., Wehbe, K., Pradell, T. Optimal Sample Preparation for the Analysis of Micrometric Heterogeneous Samples. "Analytical chemistry", 29 Maig 2015, vol. 87, núm. 13, p. 6500-6504.
dc.description.abstractPrecise microanalytical techniques are essential in many fields such as cultural heritage materials, showing complex layered microstructures containing a wide range of materials of diverse nature and hardness. Noninvasive sample manipulation and preparation is required to avoid, as much as possible, sample contamination, which may strongly limit the materials identification. The method proposed consists in the application of thin gold or carbon protecting layers before embedding the samples in synthetic resin for microtoming. The validity and optimal procedure is checked for those materials most often found on the surface of paintings: varnishes (natural resins and wax). An artwork sample is similarly prepared and analyzed by optical microscopy (OM), scanning electron microscopy (SEM/EDS), micro-infrared spectroscopy (µFTIR/µSR-FTIR), and X-ray diffraction (µSR-XRD) with synchrotron light.
dc.format.extent5 p.
dc.subjectÀrees temàtiques de la UPC::Enginyeria química::Química analítica
dc.subject.lcshSynchrotron radiation
dc.subject.lcshScanning electron microscopy
dc.subject.lcshX-ray diffractometer
dc.subject.lcshX-ray spectroscopy
dc.titleOptimal Sample Preparation for the Analysis of Micrometric Heterogeneous Samples
dc.subject.lemacQuímica analítica -- Anàlisi espectral
dc.subject.lemacEspectroscòpia infraroja
dc.subject.lemacQuímica de superfícies
dc.contributor.groupUniversitat Politècnica de Catalunya. AMPC - Anàlisi de materials de Patrimoni Cultural
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
dc.description.versionPostprint (author's final draft)
local.citation.authorBeltran, V.; Salvadó, N.; Butí, S.; Cinque, G.; Wehbe, K.; Pradell, T.
local.citation.publicationNameAnalytical chemistry

Files in this item


This item appears in the following Collection(s)

Show simple item record

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder