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dc.contributor.authorDomínguez Pumar, Manuel
dc.contributor.authorGorreta Mariné, Sergio
dc.contributor.authorPons Nin, Joan
dc.contributor.authorGomez Rodriguez, Faustino
dc.contributor.authorGonzalez Castaño, Diego
dc.contributor.authorMuschitiello, Michele
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2015-11-04T16:05:25Z
dc.date.available2015-11-04T16:05:25Z
dc.date.issued2015-06-01
dc.identifier.citationDominguez, M., Gorreta, S., Pons, J., Gomez, F., Gonzalez, D., Muschitiello , M. Closed-loop compensation of dielectric charge induced by ionizing radiation. "Journal of microelectromechanical systems", 01 Juny 2015, vol. 24, núm. 3, p. 534-536.
dc.identifier.issn1057-7157
dc.identifier.urihttp://hdl.handle.net/2117/78792
dc.description.abstractThis letter investigates the capability of dielectric charge control loops to cope with charge induced by ionizing radiation. To this effect, an microelectromechanical systems (MEMS) variable capacitor has been irradiated with X-rays and gamma-radiation in three scenarios: 1) without polarization; 2) using an open-loop dielectric charge mitigation strategy; and 3) using a closed-loop control method. The results show that the charge effects induced by radiation can be partially compensated using dielectric charge control.
dc.format.extent3 p.
dc.language.isoeng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
dc.subject.lcshDielectrics
dc.subject.lcshMicroelectromechanical systems
dc.subject.otherDielectric charging control
dc.subject.otherMEMS reliability
dc.subject.otherRadiation effects
dc.subject.otherIonizing radiation
dc.subject.otherMEMS
dc.titleClosed-loop compensation of dielectric charge induced by ionizing radiation
dc.typeArticle
dc.subject.lemacDielèctrics
dc.subject.lemacSistemes microelectromecànics
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1109/JMEMS.2015.2428733
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7109101
dc.rights.accessOpen Access
local.identifier.drac16674614
dc.description.versionPostprint (author's final draft)
dc.relation.projectidinfo:eu-repo/grantAgreement/MINECO/1PE/TEC2013-48102-C2-1-P
local.citation.authorDominguez, M.; Gorreta, S.; Pons, J.; Gomez, F.; Gonzalez, D.; Muschitiello, M.
local.citation.publicationNameJournal of microelectromechanical systems
local.citation.volume24
local.citation.number3
local.citation.startingPage534
local.citation.endingPage536


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