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dc.contributor.authorCapelli, Francesca
dc.contributor.authorRiba Ruiz, Jordi-Roger
dc.contributor.authorGonzález, David
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica
dc.identifier.citationCapelli, F., Riba, J., González, D. Optimization of short-circuit tests based on finite element analysis. A: IEEE International Conference on Industrial Technology. "Industrial Technology (ICIT), 2015 IEEE International Conference on". Sevilla: Institute of Electrical and Electronics Engineers (IEEE), 2015, p. 1368-1374.
dc.description.abstractOne of the main problems that arises when performing short-circuit tests to large loops involving substation connectors is the inductive component of the loop impedance. Transformers used to perform short-circuit tests have a secondary winding with very few turns, producing a very low output voltage. The increase in the reactive component of the impedance, which is related to loop size, limits the current output capacity, because the reactive component tends to saturate the output of the transformer and absorbs large amounts of reactive power. This paper analyzes a simple method to minimize the power requirements when conducting short-circuit tests, based on the reduction of reactive power consumption during the test. It is based on placing a wired conductor forming a closed inner loop concentric with the testing loop. The decrease of reactive power is related to the effect of the mutual inductance between the inner and outer loops. Three-dimensional finite element method (3D-FEM) simulations are used to optimize the problem, allowing changing the geometric and material properties of the inner loop. Experimental results validate the simulation method applied in this work to optimize the short-circuit tests
dc.format.extent7 p.
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectric substations
dc.subject.lcshShort circuits
dc.subject.lcshFinite element method
dc.subject.lcshMutual inductance
dc.titleOptimization of short-circuit tests based on finite element analysis
dc.typeConference report
dc.subject.lemacElements finits, Mètode dels
dc.contributor.groupUniversitat Politècnica de Catalunya. MCIA - Motion Control and Industrial Applications Research Group
dc.rights.accessRestricted access - publisher's policy
dc.description.versionPostprint (published version)
upcommons.citation.authorCapelli, F., Riba, J., González, D.
upcommons.citation.contributorIEEE International Conference on Industrial Technology
upcommons.citation.publicationNameIndustrial Technology (ICIT), 2015 IEEE International Conference on

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