Periodicity in bimodal atomic force microscopy
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hdl:2117/76907
Document typeArticle
Defense date2015-07-28
PublisherAmerican Institute of Physics (AIP)
Rights accessOpen Access
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Abstract
Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.
CitationLai, C., Barcons, V., Santos, S., Chiesa, M. Periodicity in bimodal atomic force microscopy. "Journal of applied physics", 28 Juliol 2015, núm. 4, p. 1-5.
ISSN0021-8979
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