Show simple item record

dc.contributor.authorAldrete Vidrio, Héctor
dc.contributor.authorOnabajo, M.
dc.contributor.authorAltet Sanahujes, Josep
dc.contributor.authorMateo Peña, Diego
dc.contributor.authorSilva-Martínez, José
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.identifier.citationAldrete, H. [et al.]. Non-invasive RF built-in testing using on-chip temperature sensors. A: 2009 International Test Conference (ITC). "2009 International Test Conference". Austin, Texas: IEEE Computer Society Publications, 2009, p. 1-4.
dc.description.abstractThis poster shows how to efficiently observe high-frequency figures of merit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors.
dc.format.extent4 p.
dc.publisherIEEE Computer Society Publications
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Circuits electrònics
dc.subject.lcshRadio frequency integrated circuits
dc.titleNon-invasive RF built-in testing using on-chip temperature sensors
dc.subject.lemacCircuits integrats -- Disseny
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
dc.description.versionPostprint (published version)
local.citation.authorAldrete, H.; Onabajo, M.; Altet, J.; Mateo, D.; Silva-Martínez, J.
local.citation.contributor2009 International Test Conference (ITC)
local.citation.pubplaceAustin, Texas
local.citation.publicationName2009 International Test Conference

Files in this item


This item appears in the following Collection(s)

Show simple item record

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder