Non-invasive RF built-in testing using on-chip temperature sensors

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Aldrete Vidrio, Héctor
Onabajo, M.
Altet Sanahujes, JosepMés informacióMés informació
Mateo Peña, DiegoMés informacióMés informació
Silva-Martínez, José
Document typeOther
Defense date2009-11
PublisherIEEE Computer Society Publications
Rights accessOpen Access
Abstract
CitationAldrete, H. [et al.]. Non-invasive RF built-in testing using on-chip temperature sensors. A: 2009 International Test Conference (ITC). "2009 International Test Conference". Austin, Texas: IEEE Computer Society Publications, 2009, p. 1-4. 
URIhttp://hdl.handle.net/2117/7375
ISBN978-1-4244-4867-8
Publisher versionhttp://www.itctestweek.org/
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