Non-invasive RF built-in testing using on-chip temperature sensors

Thumbnail
View/Open
Aldrete Vidrio, Héctor
Onabajo, M.
Altet Sanahujes, JosepMés informacióMés informació
Mateo Peña, DiegoMés informacióMés informació
Silva-Martínez, José
Document typeOther
Date issued2009-11
PublisherIEEE Computer Society Publications
Rights accessOpen Access
Abstract
CitationAldrete, H. [et al.]. Non-invasive RF built-in testing using on-chip temperature sensors. A: 2009 International Test Conference (ITC). "2009 International Test Conference". Austin, Texas: IEEE Computer Society Publications, 2009, p. 1-4. 
URIhttp://hdl.handle.net/2117/7375
ISBN978-1-4244-4867-8
Publisher versionhttp://www.itctestweek.org/
Collections

FilesDescriptionSizeFormatView
Non-invasive RF built-in testing.pdf371,7KbPDFView/Open
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder