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dc.contributor.authorGarcia Benadí, Albert
dc.contributor.authorShariat Panahi, Shahram
dc.contributor.authorRío Fernandez, Joaquín del
dc.contributor.authorManuel Lázaro, Antonio
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2010-03-22T19:38:18Z
dc.date.available2010-03-22T19:38:18Z
dc.date.created2009
dc.date.issued2009
dc.identifier.citationGarcia Benadí, A. [et al.]. A semi-automation procedure for dial comparators calibration. A: International Measurement Confederation. IMEKO World Congress. "XIX IMEKO World Congress. Fundamental and Applied Metrology". Lisboa: 2009, p. 1246-1249.
dc.identifier.urihttp://hdl.handle.net/2117/6769
dc.description.abstractIn this article an improvement of a calibration process of measurement equipment in the field of dimensional metrology is presented. Devices under calibration process are dial comparators. The semi-automated process is focused on the acquisition and treatment of the calibration data. The aim of the semi-automated implementation is the improvement of the process performance for error minimization produced by human factors and a reduction of time. We have implemented semi-automated process is as the operator experience and knowledge also brings quality to the calibration process itself.
dc.format.extent4 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura
dc.subject.lcshMetrology
dc.subject.lcshInstrumentation and measurement series
dc.subject.lcshUncertainty
dc.titleA semi-automation procedure for dial comparators calibration
dc.typeConference report
dc.subject.lemacMetrologia
dc.subject.lemacMesurament
dc.subject.lemacIncertitud
dc.contributor.groupUniversitat Politècnica de Catalunya. Centre de Desenvolupament Tecnològic de Sistemes d'Adquisició Remota i Tractament de la Informació (SARTI)
dc.relation.publisherversionhttp://www.imeko2009.it.pt/
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac2396873
dc.description.versionPostprint (published version)
local.citation.authorGarcia Benadí, A.; Shariat, S.; Del Rio, J.; Mànuel, A.
local.citation.contributorInternational Measurement Confederation. IMEKO World Congress
local.citation.pubplaceLisboa
local.citation.publicationNameXIX IMEKO World Congress. Fundamental and Applied Metrology
local.citation.startingPage1246
local.citation.endingPage1249


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Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain