Ir al contenido (pulsa Retorno)

Universitat Politècnica de Catalunya

    • Català
    • Castellano
    • English
    • LoginRegisterLog in (no UPC users)
  • mailContact Us
  • world English 
    • Català
    • Castellano
    • English
  • userLogin   
      LoginRegisterLog in (no UPC users)

UPCommons. Global access to UPC knowledge

Banner header
59.689 UPC E-Prints
You are here:
View Item 
  •   DSpace Home
  • E-prints
  • Grups de recerca
  • TIEG - Terrassa Industrial Electronics Group
  • Ponències/Comunicacions de congressos
  • View Item
  •   DSpace Home
  • E-prints
  • Grups de recerca
  • TIEG - Terrassa Industrial Electronics Group
  • Ponències/Comunicacions de congressos
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Characterization of EMI filters based on metamaterials

Thumbnail
View/Open
characterization.pdf (1,362Mb)
Share:
 
 
10.1109/EMCEUROPE.2009.5189682
 
  View Usage Statistics
Cita com:
hdl:2117/6382

Show full item record
Gil Galí, IgnacioMés informacióMés informacióMés informació
Fernández García, RaúlMés informacióMés informacióMés informació
Vives, Yolanda
Jauregui Tellería, Ricardo
Silva Martínez, FernandoMés informacióMés informacióMés informació
Document typeConference lecture
Defense date2009-06
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
This paper analyzes the behavior of EMI filters based on metamaterials. The filters are developed by means of sub-wavelength resonators and designed to have notch-type attenuation in the 2.45 GHz band. Two types of filters based on SRR and CSRR rings are presented. The simulated responses by MoM and FDTD are compared with the measurement data obtained from the developed prototypes.
CitationGil, I. [et al.]. Characterization of EMI filters based on metamaterials. A: EMC Europe Workshop. "EMC Europe 2009". Atenas: 2009, p. 1-3. 
URIhttp://hdl.handle.net/2117/6382
DOI10.1109/EMCEUROPE.2009.5189682
Collections
  • TIEG - Terrassa Industrial Electronics Group - Ponències/Comunicacions de congressos [123]
  • IEB - Instrumentació Electrònica i Biomèdica - Ponències/Comunicacions de congressos [144]
  • Departament d'Enginyeria Electrònica - Ponències/Comunicacions de congressos [1.643]
Share:
 
  View Usage Statistics

Show full item record

FilesDescriptionSizeFormatView
characterization.pdf1,362MbPDFView/Open

Browse

This CollectionBy Issue DateAuthorsOther contributionsTitlesSubjectsThis repositoryCommunities & CollectionsBy Issue DateAuthorsOther contributionsTitlesSubjects

© UPC Obrir en finestra nova . Servei de Biblioteques, Publicacions i Arxius

info.biblioteques@upc.edu

  • About This Repository
  • Contact Us
  • Send Feedback
  • Privacy Settings
  • Inici de la pàgina