| dc.contributor.author | Mateo Peña, Diego |
| dc.contributor.author | Altet Sanahujes, Josep |
| dc.contributor.author | Aldrete Vidrio, Héctor |
| dc.contributor.author | González Jiménez, José Luis |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2022-09-30T12:34:35Z |
| dc.date.available | 2022-09-30T12:34:35Z |
| dc.date.issued | 2006 |
| dc.identifier.citation | Mateo, D. [et al.]. Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements. A: IEEE Radio Frequency Integrated Circuits Symposium. "2006 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium: June 10-13, 2006: digest of papers". Institute of Electrical and Electronics Engineers (IEEE), 2006, p. 565-568. ISBN 0-7803-9572-7. DOI 10.1109/RFIC.2006.1651204. |
| dc.identifier.isbn | 0-7803-9572-7 |
| dc.identifier.uri | http://hdl.handle.net/2117/373800 |
| dc.description | © 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| dc.description.abstract | This paper presents a technique to obtain electrical characteristics of analog and RF circuits, based on measuring temperature at the silicon surface close to the circuit under test. Experimental results validate the feasibility of the technique. Simulated results show how this technique can be used to measure the bandwidth and central frequency of a 2.4 GHz low noise amplifier (LNA) designed in a 0.35 microns standard CMOS technology. |
| dc.format.extent | 4 p. |
| dc.language.iso | eng |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
| dc.subject.lcsh | Metal oxide semiconductors, Complementary |
| dc.subject.lcsh | Radio frequency identification systems |
| dc.subject.other | Frequency measurement |
| dc.subject.other | Circuit testing |
| dc.subject.other | CMOS technology |
| dc.subject.other | Electric variables |
| dc.subject.other | Radio frequency |
| dc.subject.other | Electric variables measurement |
| dc.subject.other | Temperature measurement |
| dc.subject.other | Silicon |
| dc.subject.other | Circuit simulation |
| dc.subject.other | Noise measurement |
| dc.title | Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements |
| dc.type | Conference report |
| dc.subject.lemac | Metall-òxid-semiconductors complementaris |
| dc.subject.lemac | Sistemes d'identificació per radiofreqüència |
| dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| dc.identifier.doi | 10.1109/RFIC.2006.1651204 |
| dc.description.peerreviewed | Peer Reviewed |
| dc.relation.publisherversion | https://ieeexplore.ieee.org/document/1651204 |
| dc.rights.access | Open Access |
| local.identifier.drac | 2365561 |
| dc.description.version | Postprint (published version) |
| local.citation.author | Mateo, D.; Altet, J.; Aldrete, H.E.; Gonzalez, J. |
| local.citation.contributor | IEEE Radio Frequency Integrated Circuits Symposium |
| local.citation.publicationName | 2006 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium: June 10-13, 2006: digest of papers |
| local.citation.startingPage | 565 |
| local.citation.endingPage | 568 |
