Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements
Document typeConference report
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessOpen Access
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This paper presents a technique to obtain electrical characteristics of analog and RF circuits, based on measuring temperature at the silicon surface close to the circuit under test. Experimental results validate the feasibility of the technique. Simulated results show how this technique can be used to measure the bandwidth and central frequency of a 2.4 GHz low noise amplifier (LNA) designed in a 0.35 microns standard CMOS technology.
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CitationMateo, D. [et al.]. Frequency characterization of a 2.4 GHz CMOS LNA by Thermal Measurements. A: IEEE Radio Frequency Integrated Circuits Symposium. "2006 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium: June 10-13, 2006: digest of papers". Institute of Electrical and Electronics Engineers (IEEE), 2006, p. 565-568. ISBN 0-7803-9572-7. DOI 10.1109/RFIC.2006.1651204.