SP2 - Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
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Document typeConference report
Defense date2022-05
Rights accessRestricted access - publisher's policy
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Abstract
This paper encompasses three contributions by industry
professionals and university researchers. The contributions
describe different trends in automotive products, including
both manufacturing test and run-time reliability strategies. The
subjects considered in this session deal with critical factors, from
optimizing the final test before shipment to market to in-field
reliability during operative life.
CitationAngione, F. [et al.]. SP2 - Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. A: 27th IEEE European Test Symposium (ETS). 2022,
Publisher versionhttps://ieeexplore.ieee.org/xpl/conhome/9810327/proceeding
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SP2-1.pdf | 4,026Mb | Restricted access |